acm-header
Sign In

Communications of the ACM

Communications of the ACM

An experimental procedure for simulation response surface model identification


An experimental method for identifying an appropriate model for a simulation response surface is presented. This technique can be used for globally identifying those factors in a simulation that have a significant influence on the output. The experiments are run in the frequency domain. A simulation model is run with input factors that oscillate at different frequencies during a run. The functional form of a response surface model for the simulation is indicated by the frequency spectrum of the output process. The statistical significance of each term in a prospective response surface model can be measured. Conditions are given for which the frequency domain approach is equivalent to ranking terms in a response surface model by their correlation with the output. Frequency domain simulation experiments typically will require many fewer computer runs than conventional run-oriented simulation experiments.

The full text of this article is premium content


 

No entries found

Log in to Read the Full Article

Sign In

Sign in using your ACM Web Account username and password to access premium content if you are an ACM member, Communications subscriber or Digital Library subscriber.

Need Access?

Please select one of the options below for access to premium content and features.

Create a Web Account

If you are already an ACM member, Communications subscriber, or Digital Library subscriber, please set up a web account to access premium content on this site.

Join the ACM

Become a member to take full advantage of ACM's outstanding computing information resources, networking opportunities, and other benefits.
  

Subscribe to Communications of the ACM Magazine

Get full access to 50+ years of CACM content and receive the print version of the magazine monthly.

Purchase the Article

Non-members can purchase this article or a copy of the magazine in which it appears.
Sign In for Full Access
» Forgot Password? » Create an ACM Web Account