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Leading Chipmakers Eye Euv Lithography to Save Moore's Law
Putting EUV to the Test: This EUV scanner (an ASML NXE:3300B) is used to print chip features at a SUNY Polytechnic Institute facility in Albany, N.Y.
Credit: IBM Research
Even after you don a bunny suit and get deep inside Fab 8, it's hard to get a sense of scale.
From IEEE Spectrum
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